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An Efficient VLSI Test Data Compression Scheme for Circular Scan Architecture Based on Modified Ant Colony Meta-heuristic Journal of Electronic Testing Vol. 36, Issue 3, 327, 2020 |
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How to cite this article
Jin Shang and Liyong Zhang, 2012. Ant Colony Algorithm and Genetic Algorithm Optimization for Test Vector Reordering. Information Technology Journal, 11: 1786-1789.
DOI: 10.3923/itj.2012.1786.1789
URL: https://scialert.net/abstract/?doi=itj.2012.1786.1789
DOI: 10.3923/itj.2012.1786.1789
URL: https://scialert.net/abstract/?doi=itj.2012.1786.1789