Asian Science Citation Index is committed to provide an authoritative, trusted and significant information by the
coverage of the most important and influential journals
to meet the needs of the global scientific community.
The fabrication of thin film based capacitors with different metal electrodes
(Al, Cu) and their application towards void fraction measurement is carried
out in this study. Void fraction is a measure of empty spaces in any medium.
The void fraction is measured as capacitance in the capillary tube and processed
through embedded system. The thin film capacitor is designed on a capillary
tube through thermal evaporation technique with the above given metal elements.
Capillary tube with different diameters ranging from 5-10 mm and length of 7
inch were used and deposited with metal elements mentioned above with a small
distance between them. The capillary tube is used as insulator with metal elements
deposited above them as metal electrodes. Changes in capacitance value due to
the voids were measured through LCR/Z meter. Before coating the electrodes on
the capillary tubes, the films were characterized for their structural, morphological
and electrical properties to obtain capacitors with desired value of capacitance.
