Research Article
High Degree of Testability Using Full Scan Chain and ATPG-An Industrial Perspective
Department of Electrical, Electronic and Systems Engineering, Universiti Kebangsaan Malaysia, 43600 UKM, Bangi, Selangor, Malaysia
Weng F. Lee
Emerald Systems Design Center, Jalan Sultan Azlan Shah, 11900 Penang, Malaysia
Nor H. Hamid
Universiti Teknologi Petronas, Bandar Seri Iskandar, 31750 Tronoh, Perak, Malaysia
Hai H. Lo
Universiti Teknologi Petronas, Bandar Seri Iskandar, 31750 Tronoh, Perak, Malaysia
Ali Y.M. Shakaff
Universiti Malaysia Perlis, Kampus Kubang Gajah, 02600 Arau, Perlis, Malaysia