Research Journal of Obstetrics and Gynecology1994-79252077-222XAsian Network for Scientific Information10.3923/rjog.2017.17.21Ariadi AuliaAde 22017102Background and Objective: The intrauterine device (IUD) is one of the safe and effective methods for long-term temporary contraceptive. Unfortunately, IUD also has a risk of expulsion. This study aims to observe the expulsion rate of intrauterine contraceptive device (IUD) which was inserted with sutured and non-sutured models on trans-cesarean section procedure and their effects on the continuity of trans-cesarean post-partum contraception. Methodology: This is an experimental study with the method of post-test control group design to determine the differences of expulsion rate between sutured and non-sutured models of trans-cesarean IUD insertion conducted at Dr. M. Djamil General Hospital in Padang, Dr. Reksodiwiryo Military Hospital in Padang and Painan District Hospital. The results of this study were analyzed using the Fishers exact test in the SPSS program version 15 (IBM Inc.) and the p-value <0.05 considered as statistically significant. Results: In this study, authors obtained 88 samples,44 patients used the sutured IUD and 44 patients used the non-sutured IUD model through trans-cesarean methods. The percentage of expulsion in the non-sutured group was 11.4%. There were no significant differences between sutured and non-sutured models of trans-cesarean IUD insertion. Conclusion: The rate of IUD expulsion was higher when it is not sutured compared to the sutured model. Statistically, there were no significant differences.]]>BKKBN.,20112011Office for National Statistics,20132013Kapp, N. and K.M. Curtis,200980327336Kittur, S. and Y.M. Kabadi,201612632Grimes, D.A., L.M. Lopez, K.F. Schulz, H.A. van Vliet and N.L. Stanwood,20102010American College of Obstetricians and Gynecologists,2011118184196Solter, C.,20082nd Edn.,Pages: 113Pages: 113Thiery, M., L. Laufe, W. Parewijck, H. van der Pas, H. van Kets, R. Derom and P. Defoort,198328299313Shukla, M., S. Qureshi and Chandrawati,2012136432435Washington, C.I., R. Jamshidi, S.F. Thung, U.A. Nayeri, A.B. Caughey and E.F. Werner,2015103131137Levi, E., E. Cantillo, V. Ades, E. Banks and A. Murthy,201286102105Jatlaoui, T.C., M. Marcus, D.J. Jamieson, P. Goedken and C. Cwiak,201489528533Chi, I.C., S.W. Zhou, S. Balogh and K. Ng,19847412811282Muller, A.L.L., J.G.L. Ramos, S.H. Martins-Costa, R.S.P. Dias and E.G. Valerio et al.,200572192195Celen, S., A. Sucak, Y. Yildiz and N. Danisman,201184240243Goldstuck, N.D. and P.S. Steyn,20135811818Treiman, K. and L. Liskin,198816126Chi, I.C. and G. Farr,19895127146Hernandez Valencia, M and L.C. Becerril Flores,2000687076, (In Spanish)Ryujin, L.,20112011Lopez, L.M., A. Bernholc, D. Hubacher, G. Stuart and H.A.A.M. van Vliet,20152015Sonalkar, S. and N. Kapp,201520418