Journal of Applied Sciences1812-56541812-5662Asian Network for Scientific Information10.3923/jas.2014.1496.1505VenkateshS.JayalalithaS.GopalS.1220141414A gamut of insulation diagnostic methods is being practiced.
Amongst them Partial Discharge (PD) detection, measurement and analysis is an
inherently non pervasive-test test procedure. Hence, it is being considered
as a crucial methodology. Over the last three decades attempts were made to
discriminate single and partially overlapped PD sources have yielded moderate
success. In the above process techniques like Fractal Features, Mixed Weibull
Function, Neural Networks (NN) and Wavelet Transformation have been implemented.
However, intricacies involved in discriminating abstruse overlapped signatures,
aspects concerning training of neural networks for large and ill-conditioned
data, complications related to varying applied voltages during measurement etc.,
continue to confront the research community. Since schemes for large dataset
training based on arbitrarily chosen centers are found to be rather impractical
and not tenable during discrimination, mixture density clustering technique
that utilizes an Expectation Maximization with Maximum Likelihood strategy is
implemented for training Homoscedastic and Heteroscedastic Probabilistic Neural
Network (PNN) variants. Detailed analysis of the ability of the PNN variants
is performed to determine the proposition of utilizing various preprocessing
techniques in discriminating the PD signatures. In addition, studies are carried
out on the PNN variants to determine the ability of the deterministically and
autonomously created Probability Density Functions (PDF) in recognition and
classification of substantially big dataset multi-source PD fingerprints due
to varying levels of applied voltages.]]>Lotfi, A. and A. Benyettou,2011Abdel-Galil, T.K., R.M. Sharkawy, M.M.A. Salama and R. Bartnikas,2005Abdel-Galil, T.K., Y.G. Hegazy, M.M.A. Salama and R. Bartinikas,2004Alamelumangai, N. and J. Devishree,2012Alesaadi, A., A. Ghaedi, A. Ghaffari and V. Parvin,2012Bishop, C.M.,1995Contin, A., A. Cavallini, G.C. Montanari, G. Pasini and F. Puletti,2002Specht, D.F.,1988Gulski, E.,1995Gulski, E. and A. Krivda,1993Vahedi, H., M. Yazdani-Asrami and M. Abedi,2012Hoof, M., B. Freisleben and R. Patsch,1997BSI,2000James, R.E. and B.T. Phung,1995Lee, J.H., T. Okamoto and C.W. Yi,2000Karthikeyan, B., S. Gopal, S. Venkatesh and S. Saravanan,2006Karthikeyan, B., S. Gopal and S. Venkatesh,2006Karthikeyan, B., S. Gopal and S. Venkatesh,2008Karthikeyan, B., S. Gopal and S. Venkatesh,2005Krivda, A.,1995Lalitha, E.M. and L. Satish,2000Mazroua, A., R. Bartnikas and M.M.A. Salama,1994Ma, X., C. Zhou and I.J. Kemp,2002Mazroua, A.A., M.M.A. Salama and R. Bartnikas,1993Sahoo, N.C., M.M.A. Salama and R. Bartnikas,2005Satish, L. and W.S. Zaengl,1994Satish, L. and W.S. Zaengl,1995Satish, L. and B.I. Gururaj,1993Streit, R.L. and T.E. Luginbuhl,1994Tortoe, C., J. Orchard, A. Beezer and J. Teetheh,2011Van Brunt, R.J.,1991Van Brunt, R.J., E.W. Cernyar and P. von Glahn,1993Venkatesh, S., S. Gopal, P.S.S. Srinivasan and B. Karthikeyan,2007Venkatesh, S. and S. Gopal,2011Xu, L. and M.I. Jordan,1996Lalitha, E.M. and L. Satish,1998