Journal of Applied Sciences1812-56541812-5662Asian Network for Scientific Information10.3923/jas.2007.1497.15034He Ions Backscattered from Metallic Surface]]>MahasnehA.A.AjlouniA.W.Abu-HaijaO.112007711A small post-accelerator has been used to measure the charge-state fractions of 0.125-0.50 MeV/amu He ions backscattered from silver films. The kinematics behavior of the backscattered ions is given by the well-known Rutherford Backscattering Spectrometry (RBS) Technique. In order to determine the film thickness at which the equilibrium film charge-state distribution occurs, we measured the charge state fractions for film thicknesses between 5.4 and 24.8 μg cm^{-2}. Deconvolution analyses of the data reveal that the charge-states of He ions backscattered from Ag-films of thickness 14.8 μg cm^{-2}, within the experimental errors, represent the equilibrium fractions. The experimental data at low energies appear to have three well-resolved peaks corresponding to the charge-state fractions of helium (He^{0}, He^{+} and He^{++}) while at higher energies only two peaks were detected corresponding to the charge-state fractions of He^{+} and He^{++}. The mean charge-state and the width of the charge-state distribution width, d, are calculated from the Gaussian model. A formula for calculating the mean charge-state, for our studied energy range, has been proposed. The method of simultaneously measuring all charge states using a single surface barrier detector (SBD) and separation using total curve deconvolution indicates that variations in experimental conditions are minimized.]]>Abufager, P.N., A.E. Martinez, R.D. Rivarola and P.D. Fainstein,2005Arafah, D.E., J.D. Meyer, H. Sharabati and A. Mahmoud,1989Arafah, D.E.,1998Baudniet-Robinet, Y., P.D. Dumont and H.P. Garnir,1978Baudinet-Robinet, Y.,1982Bentini, G.G., E. Albertazzi, M. Bianconi, R. Lotti and G. Lulli,2002Bianconi, M., G.G. Bentini, R. Lotti and R. Nipoti,2002Chu, W.K., J.W. Mayer and M.A. Nicolet,1978Goluvev, A., V. Turtikov, A. Fertman, I. Roudsoky and B. Sharkov et al.,2001Gouri, K. and A. Johnson,1977Imai, M., M. Sataka, K. Kawatsura, K. Takahiro and K. Komaki et al.,2005Itoh, A., H. Tuschida, T. Majima, A. Yogo and A. Ogawa,1999Lennard, W.N., D. Philips and D.A.S. Walker,1981Nakajima, K., Y. Okura, M. Suzuki and K. Kimura,2004Sols, F. and F. Flores,1984Stuchbery, A.S., A.N. Wilson and P.M. Davidson,2006Tordoir, X., T. Bastin, P.D. Dumont and H.P. Garinir,2001Ziegler, J.F., J.P. Biersack and N. Littmark,1985