Information Technology Journal 1812-5638 1812-5646 Asian Network for Scientific Information 10.3923/itj.2012.560.562 Yaping Yin Yanlin Wang Guili Liu Dong Li 4 2012 11 4 In the process of product defects detection, Hough algorithm is widely used in the image angle’s examines. Not only while operating it needs very big memory space, the speed and the efficiency is slowly. On this foundation an improved Hough algorithm is quoted in the image examines of Crystal chip. It can reduce calculation capacity and shorten the operation time, so, it meets the time of Crystal chips in the industry test.

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