Asian Journal of Epidemiology1992-14622077-205XAsian Network for Scientific Information10.3923/aje.2012.87.94Chaithri PonnaluriKamakshi NarneParimala SirajMohd. IshaqMohd. 3201253Sibling recurrence risk ratio (λS), defined as the ratio of
risk of disease manifestation in siblings of probands compared with risk of
disease in general population, is an extensively used measure of familial aggregation.
A λS>1 is suggestive of familial aggregation. To assess the
extent of familial clustering according to parental history of type 2 diabetes
mellitus, the sibling recurrence risks (KS) and the sibling recurrence
risk ratios (λS) were estimated in a randomly selected sample
of 275 subjects with type 2 diabetes mellitus. A total of 325 out of 1125 siblings
were affected giving an overall KS of 28.90% (95%CI: 26.21%-31.51%)
and a λS of 2.31x (95%CI: 2.09x-2.50x) which is suggestive of
a complex aetiology involving both genetic factors and environmental triggers.
The KS and the λS values were elevated in families
with one or two diabetic parents indicating that susceptibility to type 2 diabetes
mellitus is transmitted primarily through an affected parent. The risk varied
with respect to the status of the probands
parents with KS (49.21%; 95%CI: 43.04%-55.38%) and λS
(3.94x; 95%CI: 3.41x-4.43x) when both parents were affected being the highest
reflecting a predominant influence of the predisposing genetic factors. The
λS was found to be significantly higher (Z = 2.05; p = 0.04)
when the affected parent was the mother (2.59x; 95%CI: 2.20x-3.06x) rather than
the father (1.81x; 95%CI: 1.31x-2.31x) indicative of an excess of maternal transmission
of type 2 diabetes mellitus. This is the first study on sibling recurrence risk
ratio estimates for type 2 diabetes mellitus from India.]]>Arfa, I., A. Abid, D. Malouche, N. Ben Alaya and T.R. Azegue et al.,200783348351Benrahma, H., I. Arfa, M. Charif, S. Bounaceur and A. Eloualid et al.,201136943948Bo, S., P. Cavallo-Perin, L. Gentile, E. Repetti and G. Pagano,200017538542Burton, P.R., M.D. Tobin and J.L. Hopper,2005366941951Deo, S.S., S.D. Gore, D.N. Deobagkar and D.D. Deobagkar,200654441444Falconer, D.S.,19812nd Edn.,Karter, A.J., S.E. Rowell, L.M. Ackerson, B.D. Mitchell, A. Ferrara, J.V. Selby and B. Newman,199922938943Khan, N., M. Ishaq, G. Khan and E.P. Sastry,2004243639Khoury, M.J., T.H. Beaty and L. Kung-Yee,1988127674683Kim, D.J., N.H. Cho, J.H. Noh, M.S. Lee, M.K. Lee and K.W. Kim,200465117124King, H., R.E. Aubert and W.H. Herman,19982114141431Lee, S.C., G.T.C. Ko, J.K.Y. Li, C.C. Chow and V.T.F. Yeung et al.,200124646649Meigs, J.B., L.A. Cupples and P.W. Wilson,20004922012207Mohan, V., S. Sandeep, R. Deepa, B. Shah and C. Varghese,2007125217230Molyneaux, L., M. Constantino and D. Yue,20046187194Olson, J.M. and H.J. Cordell,200018217235Pincus, G. and P. White,1934188159169Ramachandran, A. and C. Snehalatha,199919158164Ramachandran, A., C. Snehalatha and V. Viswanathan,20028314711476Ramachandran, A., V. Mohan, C. Snehalatha and M. Viswanathan,19884241245Sicree, R., J. Shaw and P. Zimmet,20062006pp: 16-103pp: 16-103Sheu, W.H., Y.M. Song, W.J. Lee, Y.E. Yao and C.J. Lin et al.,199962146151De Silva, S.N., N. Weerasuriya, N.M. De Alwis, M.W. de Silva and D.J. Fernando,200258173177Tawata, M., J.I. Hayashi, K. Isobe, E. Ohkubo and M. Ohtaka et al.,20004912691272Tawata, M., M Ohtaka, E. Iwase, Y. Ikegishi, K. Aida and T. Onaya,199847276277Viswanathan, M., M.I. McCarthy, C. Snehalatha, G.A. Hitman and A. Ramachandran,199613232237Weijnen, C.F., S.S. Rich, J.B. Meigs, A.S. Krolewski and J.H. Warram,2002194150