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Balasubramaniyan, A., S. Saravanan and H.N. Upadhyay, 2013. Run-length based efficient compression for system-on-chip. J. Artif. Intel., 6: 107-111. CrossRefDirect Link |
Saravanan, S. and H.N. Upadhyay, 2012. Achieving low power test pattern by efficient compaction method for soc design. J. Artif. Intel., 5: 244-248. CrossRefDirect Link |
Wang, I.C., 2012. Cost reduction in supply chain management by shorter purchasing lead-time: A case study of flexible printed circuit boards. J. Applied Sci., 12: 271-278. CrossRef |
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Cost Reduction in Supply Chain Management by Shorter Purchasing Lead-time: A Case Study of Flexible Printed Circuit Boards Journal of Applied Sciences Vol. 12, Issue 3, 271, 2012 |
How to cite this article
Mamun B.I. Reaz, Weng F. Lee, Nor H. Hamid, Hai H. Lo and Ali Y.M. Shakaff, 2009. High Degree of Testability Using Full Scan Chain and ATPG-An Industrial Perspective. Journal of Applied Sciences, 9: 2613-2618.
DOI: 10.3923/jas.2009.2613.2618
URL: https://scialert.net/abstract/?doi=jas.2009.2613.2618
DOI: 10.3923/jas.2009.2613.2618
URL: https://scialert.net/abstract/?doi=jas.2009.2613.2618