Citation to this article as recorded by
Yang, K.J., S.H. Chen and C.K. Pai, 2011. Empirical study on the burn-in time of SDRAM products. J. Applied Sci., 11: 2200-2206. CrossRefDirect Link |
Citation to this article as recorded by
Empirical Study on the Burn-in Time of SDRAM Products Journal of Applied Sciences Vol. 11, Issue 12, 2200, 2011 |
How to cite this article
A. Peiravi and N. Dehqanmongabadi, 2008. Accelerated Life Testing Based on Proportional Mean Residual Life Model for Multiple Failure Modes. Journal of Applied Sciences, 8: 4166-4172.
DOI: 10.3923/jas.2008.4166.4172
URL: https://scialert.net/abstract/?doi=jas.2008.4166.4172
DOI: 10.3923/jas.2008.4166.4172
URL: https://scialert.net/abstract/?doi=jas.2008.4166.4172