Research Article

Citations for "Overview of Radiation Hardening Techniques for IC Design"


Citation to this article as recorded by ASCI logo


Gu, F., C. Ling, J. Kuang and Y. Zhou, 2012. Fault tolerance structure of radix 2 signed digital adders. Inform. Technol. J., 11: 1442-1448.
CrossRef  |  Direct Link  |  

V. Elamaran and H.N. Upadhyay, 2015. CMOS VLSI design of low power SRAM cell architectures with new TMR: a layout approach. Asian J. Sci. Res., 8: 466-477.
CrossRef  |  Direct Link  |  


Citations in impact factor journal as recorded by Crossref logo


Development of underwater 3D shape measurement system with improved radiation tolerance
Nuclear Engineering and Technology Vol. 53, Issue 4, 1189, 2021


Citation to this article as recorded by Crossref logo


High energy X-ray radiation sensitive scintillating materials for medical imaging, cancer diagnosis and therapy
Nano Energy

An overview of radiation effects on electronic devices under severe accident conditions in NPPs, rad-hardened design techniques and simulation tools
Progress in Nuclear Energy

Review on Radiation Hardness Assurance by Design, Process and NextGen Devices
Journal of Physics: Conference Series Vol. 1916, Issue 1, 012002, 2021

Radiation Hardened Circuits in Multiple Harsh Environments
IOP Conference Series: Materials Science and Engineering

Design of an RFID-based positioning system for safety of personnel in nuclear facilities
2021 International Conference on Indoor Positioning and Indoor Navigation (IPIN)

Influence of Total Ionizing Dose on Magnetic Tunnel Junctions With Perpendicular Anisotropy
IEEE Transactions on Nuclear Science Vol. 68, Issue 5, 748, 2021

Space environment effects on equipment and structures—current and future technologies
The Journal of Defense Modeling and Simulation: Applications, Methodology, Technology

Services
Related Articles in ASCI
Search in Google Scholar
View Citation
Report Citation

 
©  2022 Science Alert. All Rights Reserved