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Citations for "Overview of Radiation Hardening Techniques for IC Design"

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Gu, F., C. Ling, J. Kuang and Y. Zhou, 2012. Fault tolerance structure of radix 2 signed digital adders. Inform. Technol. J., 11: 1442-1448.
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V. Elamaran and H.N. Upadhyay, 2015. CMOS VLSI design of low power SRAM cell architectures with new TMR: a layout approach. Asian J. Sci. Res., 8: 466-477.
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Citations in impact factor journal as recorded by Crossref logo

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Nuclear Engineering and Technology Vol. 53, Issue 4, 1189, 2021

Citation to this article as recorded by Crossref logo

High energy X-ray radiation sensitive scintillating materials for medical imaging, cancer diagnosis and therapy
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Review on Radiation Hardness Assurance by Design, Process and NextGen Devices
Journal of Physics: Conference Series Vol. 1916, Issue 1, 012002, 2021

Radiation Hardened Circuits in Multiple Harsh Environments
IOP Conference Series: Materials Science and Engineering

Design of an RFID-based positioning system for safety of personnel in nuclear facilities
2021 International Conference on Indoor Positioning and Indoor Navigation (IPIN)

Influence of Total Ionizing Dose on Magnetic Tunnel Junctions With Perpendicular Anisotropy
IEEE Transactions on Nuclear Science Vol. 68, Issue 5, 748, 2021

Space environment effects on equipment and structures—current and future technologies
The Journal of Defense Modeling and Simulation: Applications, Methodology, Technology

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