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Journal of Applied Sciences

Year: 2004 | Volume: 4 | Issue: 4 | Page No.: 521-525
DOI: 10.3923/jas.2004.521.525
Base Transport Limited Current Gain Analysis for Low-Noise SiGe DHBTs
Khanduri Gagan and Panwar Brishbhan

Abstract: An analysis of current gain and cutoff frequency for very high maximum oscillation frequency NPN Si/SiGe/Si double heterojunction bipolar transistors (SiGe DHBTs) has been performed. The simulation results for a Box-Germanium and a Box-triangular-Germanium profile in the base of SiGe DHBT are compared while the Ge profile is kept under the critical thickness limit constraint in both the cases. The Box-triangular-Germanium profile SiGe DHBT shows a superior current gain and cut-off frequency owing to an improved base transport limited current gain.

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How to cite this article
Khanduri Gagan and Panwar Brishbhan, 2004. Base Transport Limited Current Gain Analysis for Low-Noise SiGe DHBTs. Journal of Applied Sciences, 4: 521-525.

Keywords: sige dhbts, base transport, low noise, current gain and base recombination

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