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Articles
by
Zhiyu Wang |
Total Records (
5 ) for
Zhiyu Wang |
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Liping Wang
,
Jiarui Liu
,
Huaqing Tong
,
Ming Hong
,
Yiqun Hu
,
Xiuqin Xu
,
Hua Chen
,
Zhiyu Wang
,
Yongheng Shang
,
Zhengliang Huang
and
Faxin Yu
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A novel highly integrated front-end T/R module with eight RF channels for the application of a K-band transceiver is presented. The proposed T/R module is based on the LTCC package combined with embedded microwave passive circuits and a variety of microwave transistor dies. Due to the applied multi-layer LTCC technology, the overall size and weight of the designed module is greatly reduced. Furthermore, such design improves the overall performance of the T/R module with a lower cost and high efficiency. |
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Qin Zheng
,
Yongheng Shang
,
Zhiyu Wang
,
Jiarui Liu
,
Min Zhou
,
Xiuqin Xu
,
Liping Wang
,
Hua Chen
,
Zhengliang Huang
,
Zheming Lu
and
Faxin Yu
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In this study, an automated testing system for a reflection-type Vector Modulators (VM) comprised of a Field Programmable Gate Array (FPGA) and a LabVIEW based testing software is presented. The testing system with a friendly Graphic User Interface (GUI) is able to evaluate all the functionality of the VMs and allows the user to test the FPGA module step-by-step or to automate the testing in a sequential way. In case of multiple VM testing, all the VMs can be tested in one time by automatically sending the control commands to manipulate the bias voltage of each VM. Only one FPGA based hardware is needed in the testing system for the bias voltage control. This present testing system is highly efficient for VM testing and can be easily generalized to the testing of other VMs. |
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Mengyao Su
,
Jiarui Liu
,
Hua Chen
,
Dongdong Liu
,
Min Zhou
,
Zhiyu Wang
,
Yongheng Shang
,
Zhengliang Huang
and
Faxin Yu
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This study presents a design of a highly reliable shift register
based on TSMC 0.18 μm process which can efficiently fight against the Single
Event Upset (SEU). A bilateral Power on Reset (POR) block, together with bit-line
segregation and tri-mode redundancy technologies are applied in this design
to comprehensively enhance the SEU hardening performance at both system level
and circuit level. Assisted by the theory of transient circuit analysis, the
shift registers SEU hardening performance is achieved from the aspects of both
schematic and layout. A current pulse which is used to emulate the SEU effect,
is injected in the circuit for verification. The result of simulation shows
great improvement of the SEU tolerance. With its high reliability and radiation
tolerance, the present shift register can be applied to CMOS chip designs in
the field of aerospace. |
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Wei Chen
,
Xiuqin Xu
,
Hui Xu
,
Ming Hong
,
Zhiyu Wang
,
Yongheng Shang
,
Dongdong Liu
,
Min Zhou
,
Zhengliang Huang
and
Faxin Yu
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This study presents the temporal Coupled-Mode Theory (CMT) analysis of a K-band
MMIC (Microwave Monolithic Integrated Circuit) bandpass filter with dual orthogonal
resonant modes. Two test methods are applied and compared in the filter response
measurement. The dimensions of the MMIC filter, whose chip size is 1.9×1.35
mm, are optimized based on the FEM (Finite Element Method) simulation assisted
temporal coupled-mode theory. As a two-port reciprocal system, the transmission
and reflection responses of the filter are deduced. GaAs MMIC IPD (Integrated
Passive Device) technology is applied for chip fabrication. The test results
using a probe station fit well with the simulation results. A testing fixture
is introduced to model the practical application scenario, whose measurement
results, after de-embedment, have shown consistency with the simulation and
the probe station test results. |
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Jungang Yang
,
Jie Zhang
,
Yihua Ma
and
Zhiyu Wang
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The objective of this research was to investigate the process
features of etchers and automatically provide mass multi-characteristics data
for fault detection test. Before applying a fault detection system in a modern
semiconductor wafer fabrication system, a great number of experiments and tests
must be carried out to ensure the effectiveness and efficiency of the system.
However, it is difficult to collect and storage different types of data with
different characteristics for testing. This study proposed a Markov Property
considered data generation approach based on analysis of the process state changes
in etchers. The markov property of etchers state changes was demonstrated
and a data generation model was built. Comparing with the existed historical
data based data generation method and random data generation method, the proposed
method considered not only statistical information from historical data but
also the impact of the etchers' state changes. Experiments and industrial examples
were used to measure the performance of the proposed method and results show
that it has advantages such as simple expression, rapid and automatic data generation
and easy reconfiguration, therefore is especially useful for the Fault Detection
system test and simulation. |
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