Articles by K Saitoh (3)

Coherent electron interference from amorphous TEM specimens

R. A Herring, K Saitoh, N Tanaka and T. Tanji

Journal of Electron Microscopy 59 ( 5 ): 321 - 329 , 2010

Automated characterization of bending and expansion of a lattice of a Si substrate near a SiGe/Si interface by using split HOLZ line patterns

K Saitoh, Y Yasuda, M Hamabe and N. Tanaka

Journal of Electron Microscopy 59 ( 5 ): 367 - 378 , 2010

Atom-column distinction by Kikuchi pattern observed by an aberration-corrected convergent electron probe

K Saitoh, Y Tatara and N. Tanaka

Journal of Electron Microscopy 59 ( 5 ): 387 - 394 , 2010

Do you have a suggestion for journals

Suggest Journal