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Articles by K Saitoh
Total Records ( 3 ) for K Saitoh
  R. A Herring , K Saitoh , N Tanaka and T. Tanji
 

For the first time, the electron intensity on the diffraction plane from amorphous transmission electron microscope (TEM) specimens has been found to have sufficient coherence to produce fringes in interferograms that were created using a wavefront splitting method of diffracted beam interferometry. The fringes were found to exist from low to high electron-scattering angles. Their spatial frequency depended on the angular overlap of the interfering beams, which was controlled by an electron biprism. From these interferograms, phase information of amorphous materials, which is information now lacking and required for determining their atomic structures, was obtained. An immediate application of this interference is a new method to determine the spatial resolution of the TEM that occurs at the shear angle for fringe disappearance.

  K Saitoh , Y Yasuda , M Hamabe and N. Tanaka
 

A method to determine lattice parameters and parameters characterizing the bending strain of the lattice, the direction and magnitude of the displacement field of the bending strain, by using higher-order Laue zone (HOLZ) reflection lines observed in convergent-beam electron diffraction patterns is proposed. In this method, all of the parameters are simultaneously determined by a fit of two Hough transforms of experimental and kinematically simulated HOLZ line patterns. This method has been used to obtain two-dimensional maps of lattice parameter a, the direction and relative magnitude of the displacement field in a Si substrate near a SiGe/Si interface.

  K Saitoh , Y Tatara and N. Tanaka
 

Kikuchi patterns of an MgO crystal at the [110] incidence have been taken by a sub-angstrom electron beam focused on the single atom-column. A significant change in intensity has been observed in the 111 band; that is, the contrast in the central and side bands is reversed depending on the illuminated atom-column. The contrast reversal in the 111 band has been reproduced by multislice simulation using the frozen-phonon approach. The beam-position dependence of the 111 band intensity can be interpreted by electron channelling and the reciprocity theorem. The anomalous Kikuchi pattern can be a probe for identifying the illuminated atom-column, which is useful for column-by-column electron energy-loss spectroscopy and X-ray emission spectroscopy.

 
 
 
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