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Journal of Electron Microscopy
Year: 2009  |  Volume: 58  |  Issue: 3  |  Page No.: 131 - 136

Local crystal structure analysis with 10-pm accuracy using scanning transmission electron microscopy

M Saito, K Kimoto, T Nagai, S Fukushima, D Akahoshi, H Kuwahara, Y Matsui and K. Ishizuka    


We demonstrate local crystal structure analysis based on annular dark-field (ADF) imaging in scanning transmission electron microscopy (STEM). Using a stabilized STEM instrument and customized software, we first realize high accuracy of elemental discrimination and atom-position determination with a 10-pm-order accuracy, which can reveal major cation displacements associated with a variety of material properties, e.g. ferroelectricity and colossal magnetoresistivity. A-site ordered/disordered perovskite manganites Tb0.5Ba0.5MnO3 are analysed; A-site ordering and a Mn-site displacement of 12 pm are detected in each specific atomic column. This method can be applied to practical and advanced materials, e.g. strongly correlated electron materials.

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