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Journal of Engineering and Applied Sciences
Year: 2011  |  Volume: 6  |  Issue: 6  |  Page No.: 358 - 360

Study the Nano-Structures of Cooper Thin Films as a Function of Depletion Angle

Saeid Rafizadeh    

Abstract: Cooper thin films of 54.3 nm thickness were prepared by resistive evaporation method under HV conditions with three different deposition angles namely, vertical, 25° and 35° at the room temperature and on glass substrates. The nano-structures of these layers are studied by AFM and XRD methods. The aim of this research is to investigate correlation between nano-structures and depletion angle in HV condition. All the layers are amorphous and by increasing the depletion angle bigger grains produced and more voids will be configured between them. At vertical depletion angle, roughness of the surface increases and also we encounter with more transmission and less reflection at VIS light wavelength.

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