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Information Technology Journal
Year: 2007  |  Volume: 6  |  Issue: 8  |  Page No.: 1245 - 1251

Wafer Pre-Aligner System Based on Vision Information Processing

Ming Cong, Xiangji Kong, Yu Du and Jing Liu    

Abstract: Wafer pre-alignment is one of the most difficult and important part in wafer transmitting system. The key point of alignment is the position identification and information process. It is explored in this paper to use a new algorithm of vision information processing to obtain the special area of wafer edge and then concentrate to some feature points of wafer by which the wafer can be located. The basis principle of algorithm is to integrate least squares regression fitting, weighted means and compromise of wavelet coefficient method together in vision part. Also a new mechanical structure and vision system has been established to process the data and locate wafer. Experimental test is given showing that the system can carry out the alignment of wafer well and accurately by using the proposed algorithm and structure.

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