How to cite this article:
Mamun B.I. Reaz, Weng F. Lee, Nor H. Hamid, Hai H. Lo and Ali Y.M. Shakaff, 2009. High Degree of Testability Using Full Scan Chain and ATPG-An Industrial Perspective. Journal of Applied Sciences, 9: 2613-2618.
DOI: 10.3923/jas.2009.2613.2618
URL: https://scialert.net/abstract/?doi=jas.2009.2613.2618
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