Yinghui Liu
School of Mechatronics Engineering and Automation, Shanghai University, Shanghai 200072, China
Shulin Liu
School of Mechatronics Engineering and Automation, Shanghai University, Shanghai 200072, China
Yuzhen Li
School of Mechatronics Engineering and Automation, Shanghai University, Shanghai 200072, China
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Yinghui Liu, Shulin Liu and Yuzhen Li, 2013. A Novel Detector Generation Scheme for Detecting the Level of Abnormality of Equipment. Information Technology Journal, 12: 338-344.
DOI: 10.3923/itj.2013.338.344
URL: https://scialert.net/abstract/?doi=itj.2013.338.344
DOI: 10.3923/itj.2013.338.344
URL: https://scialert.net/abstract/?doi=itj.2013.338.344