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Information Technology Journal

Year: 2013 | Volume: 12 | Issue: 1 | Page No.: 204-208
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Authors

Jin Shang

Liyong Zhang

Keywords

Research Article

Test Data Compression Scheme Based on Compatible Data Block Coding

Jin Shang and Liyong Zhang
In order to reduce the storage requirements for the test pattern, a test data compression scheme based on compatible data block coding is presented. In the scheme, binary code is used to express the test data which are compatible or inversely compatible with reference data which are improved compression radio. The circuit structure of decompression with a Finite State Machine (FSM) and a Cyclical Scan Register (CSR) was proposed. Experimental results for the large ISCAS 89 benchmark circuits show that this scheme is a very efficient compression method than other compression schemes and the average compression ratio of up to 63.89%.
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