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International Journal of Agricultural Research
  Year: 2011 | Volume: 6 | Issue: 10 | Page No.: 747-753
DOI: 10.3923/ijar.2011.747.753
 
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Genetic Improvement in Yield, Yield Attributes and Leaf Rust Resistance in Semi-dwarf Wheat Varieties Developed in India from Last 40 Years

B. Abrar Yasin, M. Ram, Shubhra Singh and B.A Wani

Abstract:
India witnessed Green Revolution with the introduction of semi-dwarf wheat varieties like Kalyan Sona and Sonalika from CIMMYT Mexico in 1963. However, from last seven years the total wheat production remained stagnated. Therefore, present investigation was undertaken to determine yield ceiling, improvement brought in yield, yield attributes and leaf rust resistance in newly released wheat varieties. The trials were laid down in Randomized Block Design (RBD) with four replications during two consecutive years 2005-06 and 2006-07. Data were recorded on 8 quantitative characters and were subjected to different statistical analysis. Mean performance of yield, yield attributes and leaf rust resistance of 13 promising newly released wheat varieties were compared with Kalyan Sona and Sonalika (Checks). The pooled yield data of two years indicate that PBW-343 and HD-2733 are the top yielding varieties. PBW-343 showed significant improvement in the mean yield performance over Kalyan Sona but non-significant improvement over Sonalika. PBW-343 and HD-2733 recorded maximum number of tillers/plant, spike length, grain/spike, harvest index and 1000 grain weight. However, their differences in mean values were non-significant over checks. Almost all latest wheat varieties (except HUW-318, Veeri, K-816, Kalyan Sona and Sonalika) have shown good degree of resistance to leaf rust races. It is concluded from present investigation that in wheat yield ceiling has reached once again. There has been no significant improvement brought in yield and yield attributes through breeding researches in India since 1969-2005. Resistance to leaf rust has been appreciated.
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How to cite this article:

B. Abrar Yasin, M. Ram, Shubhra Singh and B.A Wani, 2011. Genetic Improvement in Yield, Yield Attributes and Leaf Rust Resistance in Semi-dwarf Wheat Varieties Developed in India from Last 40 Years. International Journal of Agricultural Research, 6: 747-753.

DOI: 10.3923/ijar.2011.747.753

URL: https://scialert.net/abstract/?doi=ijar.2011.747.753

COMMENTS
22 July, 2017
Yousef sami:
A very informative paper, congratulations to authors for such a nice work.
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