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Trends in Applied Sciences Research

Year: 2009 | Volume: 4 | Issue: 2 | Page No.: 73-78
DOI: 10.17311/tasr.2009.73.78
Application of Young Slits Technique: Measurement of the Phase of the Diffracted Field in Optical Domain
D.K. Konan, B.K. Koffi, A. Tanoh, M. Koffi, Z. Yeo, K. Konan and R.K. N`guessan

Abstract: This study presents a new technique to measure the phase difference between two diffracted fields: The field diffracted by a reference object and the field diffracted by an unknown object. For that we use the interferential technique of Young slits. We measured the phase difference between the diffracted fields of two rods of resin. And knowing the phase of the diffracted field of the reference object helps deducing the phase of the field diffracted by the sample. This setup is simple and it is very strong in the presence of disturbances because both objects are illuminated with the same incident beam. Moreover, this technique allows us measuring the phase of the diffracted field on a wide range of angle so that a high resolution of the image can be obtained.

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How to cite this article
D.K. Konan, B.K. Koffi, A. Tanoh, M. Koffi, Z. Yeo, K. Konan and R.K. N`guessan, 2009. Application of Young Slits Technique: Measurement of the Phase of the Diffracted Field in Optical Domain. Trends in Applied Sciences Research, 4: 73-78.

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