Abstract: In this study, the undoped MnO2 was deposited using spray pyrolysis technique. The manganese (II) acetate tetra hydrate was taken as 0.1M. The film was then annealed at 450°C for 5 h to obtain crystalline peak. The XRD result for the undoped MnO2 film shows (110) plane peak with maximum intensity. Optical property shows an increase in transmittance for annealed film and band gap was found to be 2.4 eV. The Electrical property indicates the semiconducting nature of the film. The ZnMn2O4 film was obtained from aqueous solution manganese (II) acetate tetra hydrate and Zinc acetate dihydrate salt of 0.01:0.01 molar concentration. After annealing the film at 450°C for 5 h, the crystalline peak was observed. The XRD results of ZnMn2O4 film shows crystalline peaks of (211) and (111) plane. The optical properties shows an increase in transmittance than MnO2 film. The structural, electrical and morphology properties of the film as a function of annealing temperature were analysed and reported.