Abstract: Manganese containing Diluted Magnetic Semiconductors (DMS) have recently attracted much attention due to their potential applications in solar selective coatings, solar cells, sensors, photoconductors etc. Among the available DMSs, Manganese Sulphide (MnS) is broadly studied because of its magneto-optical properties and wide band gap nature. In present study, first time, MnS thin films were deposited onto glass substrates by nebulizer technique using the precursor solutions of manganese chloride (MnCl2.4H2O) and thiourea (SC(NH)2)2 at a temperature of 350°C. The molar concentrations were varied from 0.25-1.5 M. The structural, optical and morphological studies of deposited films were carried out using x-ray diffractometer, UV-Vis-NIR spectrophotometer and scanning electron microscope, respectively. X-ray diffraction results revealed the crystallinity of MnS films improved with increasing precursor solution concentration. The absorption edges shift towards lower wavelength region, indicating a systematic raise in energy band gap with increasing precursor solution concentration up to 1.0 M which attributed to the lower defect density near the band edge. The broad emission peak at 420 nm corresponding to the band edge emission was observed in the PL spectra. The morphological study revealed the polycrystalline nature of the deposited MnS thin film.