Abstract: The aim of this work is to show the interest in using the deterministic fractal structures in the building of specific condensers compared to traditional plans condensers. Research relates on MOS condensers of which one of the plates is of fractional dimension. In the case of this work, it is about fractal tree of dimension 1.46 and Sierpinski carpet of dimension 1.89. The capacitive behavior of these particular condensers in which one of the plates is of fractional dimension is compared to traditional plane plate condensers. This study made it possible to note that MOS capacitors with fractional dimension have interests other than the value of the capacities they bring back but on the weakness of the dielectric constant. The study presented here is on the one hand, the development of the technological process of realization of the samples. On the other hand, the extraction of the capacities values of the samples previously mentioned above that are compared with those of the control plans capacities.