Azizollah Yousefi Salekdeh
Department of Engineering, Lahijan Branch, Islamic Azad University, Lahijan, Iran
Ali Koochi
Engineering Group, Naein Branch, Islamic Azad University, Naein, Iran
Yaghoub Tadi Beni
Faculty of Engineering, University of Shahrekord, Shahrekord, Iran
Mohamadreza Abadyan
Department of Engineering, Shahrekord Branch, Islamic Azad University, Shahrekord, Iran
PDF Fulltext XML References Citation
How to cite this article
Azizollah Yousefi Salekdeh, Ali Koochi, Yaghoub Tadi Beni and Mohamadreza Abadyan, 2012. Modeling Effects of Three Nano-scale Physical Phenomena on Instability Voltage of Multi-layer MEMS/NEMS: Material Size Dependency, van der Waals Force and Non-classic Support Conditions. Trends in Applied Sciences Research, 7: 1-17.
URL: https://scialert.net/abstract/?doi=tasr.2012.1.17
URL: https://scialert.net/abstract/?doi=tasr.2012.1.17