
	Trends in Applied Sciences Research
	Year: 2006 \| Volume: 1 \| Issue: 4 \| Page No.: 362-367 DOI: 10.3923/tasr.2006.362.367

Structural Properties of Screen Printed Thick Films of Zn_xCd_1-xS Prepared by Flux Technique

L.A. Patil, A.M. Patil and M.S. Wagh

Abstract: All possible compositions of Zn_xCd_1-xS [0.1≤x≤0.9] were prepared by flux technique using Na₂S-S flux for first time. Thick films of each composition are prepared by screen printing technique. Interplaner spacings, lattice parameters, unit cell volume of these compositions were determined using XRD patterns. X-ray studies show that Wurtzite structure is the only stable phase throughout the composition. The latice parameters vary with composition in accordance with vegard's law.

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How to cite this article:

L.A. Patil, A.M. Patil and M.S. Wagh , 2006. Structural Properties of Screen Printed Thick Films of Zn_xCd_1-xS Prepared by Flux Technique. Trends in Applied Sciences Research, 1: 362-367.

DOI: 10.3923/tasr.2006.362.367

URL: https://scialert.net/abstract/?doi=tasr.2006.362.367

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Structural Properties of Screen Printed Thick Films of ZnxCd1-xS Prepared by Flux Technique

Structural Properties of Screen Printed Thick Films of Zn_xCd_1-xS Prepared by Flux Technique