Jungang Yang
Institute of Computer Integrated Manufacturing, Shanghai Jiao Tong University, Shanghai, 200240, People�s Republic of China
Jie Zhang
Institute of Computer Integrated Manufacturing, Shanghai Jiao Tong University, Shanghai,
200240, People�s Republic of China
Yihua Ma
Shanghai Baosight Software Co., Ltd, Shanghai, 201203, People�s Republic of China
Zhiyu Wang
Shanghai Baosight Software Co., Ltd, Shanghai, 201203, People�s Republic of China
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How to cite this article
Jungang Yang, Jie Zhang, Yihua Ma and Zhiyu Wang, 2013. A Markov Property Considered Data Generation Approach for Etchers Fault Detection Test. Journal of Applied Sciences, 13: 4695-4701.
DOI: 10.3923/jas.2013.4695.4701
URL: https://scialert.net/abstract/?doi=jas.2013.4695.4701
DOI: 10.3923/jas.2013.4695.4701
URL: https://scialert.net/abstract/?doi=jas.2013.4695.4701