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Journal of Applied Sciences
  Year: 2012 | Volume: 12 | Issue: 10 | Page No.: 985-991
DOI: 10.3923/jas.2012.985.991
 
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Quality Improvement through First Pass Yield using Statistical Process Control Approach

R. Raj Mohan, K. Thiruppathi, R. Venkatraman and S. Raghuraman

Abstract:
The objective of this study was to improve First Pass Yield (FPY) and reduce the defect rate of a product. Nowadays, the competitive manufacturing background illustrates that the customers always demanding higher quality in product. Therefore, suppliers strive to satisfy the customer needs beside they are trying to reduce the operating cost and to stay profitable. To survive in a spirited market, improving quality of product is must for any company. In this study, data regarding quantity output of good parts and defective parts has been collected from daily check sheet, critical issues related to defective parts were identified using Pareto analysis chart and its root causes were identified using fishbone diagram. Finally, improvement action plan for critical issues were suggested for quality improvement. After the accomplishment of the action plan, the existing first pass yield is compared with the preliminary first pass yield and substantial improvement in first pass yield attained indicates that defect rate decline with improvement in quality.
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How to cite this article:

R. Raj Mohan, K. Thiruppathi, R. Venkatraman and S. Raghuraman, 2012. Quality Improvement through First Pass Yield using Statistical Process Control Approach. Journal of Applied Sciences, 12: 985-991.

DOI: 10.3923/jas.2012.985.991

URL: https://scialert.net/abstract/?doi=jas.2012.985.991

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