A.V. Muhammed Ali
Department of Physics, Manipal Institute of Technology, Manipal University, Manipal, India
Dhananjaya Kekuda
Department of Physics, Manipal Institute of Technology, Manipal University, Manipal, India
PDF Fulltext XML References Citation
How to cite this article
A.V. Muhammed Ali and Dhananjaya Kekuda, 2012. Thickness and Oxygen Partial Pressure Dependence on Optical Band Gap of Indium
Oxide by Reactive Evaporation Method. Journal of Applied Sciences, 12: 1718-1721.
DOI: 10.3923/jas.2012.1718.1721
URL: https://scialert.net/abstract/?doi=jas.2012.1718.1721
DOI: 10.3923/jas.2012.1718.1721
URL: https://scialert.net/abstract/?doi=jas.2012.1718.1721