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Journal of Applied Sciences
  Year: 2005 | Volume: 5 | Issue: 9 | Page No.: 1597-1601
DOI: 10.3923/jas.2005.1597.1601
 
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Goodness-of-Fit Tests for GEE Models Using Kappa-like Statistic to Diabetes Mellitus Study

Md. Abdus Salam Akanda and Maksuda Khanam

Abstract:
A kappa-like classification statistic is used for assessing the fit of GEE regression models with a categorical response. The statistic is a summary measure depicting how well categorical responses are predicted from the fitted GEE model. The statistic takes on a value of 1 if prediction is perfect and a value of 0 if the fitted model fares no better than random chance, i.e., fitting the repeated categorical responses with an intercept-only model. To assess the performance of the classification statistic, we conducted analyses by using BIRDEM data and the concern is assessing the fit of the GEE categorical response models by determining how well the covariates predict the subject’s responses.
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How to cite this article:

Md. Abdus Salam Akanda and Maksuda Khanam , 2005. Goodness-of-Fit Tests for GEE Models Using Kappa-like Statistic to Diabetes Mellitus Study. Journal of Applied Sciences, 5: 1597-1601.

DOI: 10.3923/jas.2005.1597.1601

URL: https://scialert.net/abstract/?doi=jas.2005.1597.1601

COMMENTS
10 July, 2011
Dr. Michael Winckler:
Authors nicely presented the application of GEE model by using kappa-like classification statistic.
15 July, 2011
Prof Paul Blackwell :
Thnaks to authors for this excellent research work on GEE using kappa-like classification statistic. Looking forward to the next one.
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