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Information Technology Journal
  Year: 2014 | Volume: 13 | Issue: 18 | Page No.: 2736-2742
DOI: 10.3923/itj.2014.2736.2742
 
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Temporal Coupled-Mode Theory Analysis and Test Methods Comparison of a K-Band MMIC Bandpass Filter with Dual Orthogonal Resonant Modes

Wei Chen, Xiuqin Xu, Hui Xu, Ming Hong, Zhiyu Wang, Yongheng Shang, Dongdong Liu, Min Zhou, Zhengliang Huang and Faxin Yu

Abstract:
This study presents the temporal Coupled-Mode Theory (CMT) analysis of a K-band MMIC (Microwave Monolithic Integrated Circuit) bandpass filter with dual orthogonal resonant modes. Two test methods are applied and compared in the filter response measurement. The dimensions of the MMIC filter, whose chip size is 1.9×1.35 mm, are optimized based on the FEM (Finite Element Method) simulation assisted temporal coupled-mode theory. As a two-port reciprocal system, the transmission and reflection responses of the filter are deduced. GaAs MMIC IPD (Integrated Passive Device) technology is applied for chip fabrication. The test results using a probe station fit well with the simulation results. A testing fixture is introduced to model the practical application scenario, whose measurement results, after de-embedment, have shown consistency with the simulation and the probe station test results.
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How to cite this article:

Wei Chen, Xiuqin Xu, Hui Xu, Ming Hong, Zhiyu Wang, Yongheng Shang, Dongdong Liu, Min Zhou, Zhengliang Huang and Faxin Yu, 2014. Temporal Coupled-Mode Theory Analysis and Test Methods Comparison of a K-Band MMIC Bandpass Filter with Dual Orthogonal Resonant Modes. Information Technology Journal, 13: 2736-2742.

DOI: 10.3923/itj.2014.2736.2742

URL: https://scialert.net/abstract/?doi=itj.2014.2736.2742

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