L. Bai
School of Information Engineering, Henan Institute of Science and Technology, Xinxiang, China
F. Chen
School of Information Engineering, Henan Institute of Science and Technology, Xinxiang, China
X. Zeng
Department of Control Science and Engineering, Huazhong University of Science and Technology, Wuhan, China
PDF Fulltext XML References Citation
How to cite this article
L. Bai, F. Chen and X. Zeng, 2008. Application of Markov Random Field in Depth Information Estimation of Microscope Defocus Image. Information Technology Journal, 7: 808-813.
DOI: 10.3923/itj.2008.808.813
URL: https://scialert.net/abstract/?doi=itj.2008.808.813
DOI: 10.3923/itj.2008.808.813
URL: https://scialert.net/abstract/?doi=itj.2008.808.813