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International Journal of Plant Breeding and Genetics

Year: 2008 | Volume: 2 | Issue: 2 | Page No.: 51-63
DOI: 10.3923/ijpbg.2008.51.63

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Authors


A. Asfaw


T. Assefa


B. Amsalu


K. Negash


F. Alemayehu


F. Gurum


Y. Rezene


C. Finenissa


Mulugeta Atnafi


Chemeda Daba


Keywords


  • yield stability
  • Phaseolus vulgaris
  • genotypexlocation interaction
  • Common bean
Research Article

Adaptation and Yield Stability of Small Red Bean Elite Lines in Ethiopia

A. Asfaw, T. Assefa, B. Amsalu, K. Negash, F. Alemayehu, F. Gurum, Y. Rezene, C. Finenissa, Mulugeta Atnafi and Chemeda Daba
Different stability analyses ranging from univariate nonparametric to multivariate parametric methods were employed in this study for the assessment of stability and adaptability of genotypes and evaluation of test locations for their discrimitiveness and representativeness. Replicated grain yield data of 16 elite small red bean genotypes tested in national variety trials at nine locations representing major bean production environments in Ethiopia for two years were used for the analysis. The results from the analysis revealed presence of cross over genotype x location interactions. The magnitude of location x year interaction indicated considerable intra-location variation in genotypic response pattern over years. The observed inter and intra-locations variation in genotypic response complicated the identification of high yielding stable genotypes across locations with both parametric and nonparametric stability estimates. However, with genotype plus genotypexlocation interaction (GGL) biplots of the site regression (SREG) model analysis, the overall picture of the genotypes at different locations and testing ability of the locations were assessed.
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How to cite this article

A. Asfaw, T. Assefa, B. Amsalu, K. Negash, F. Alemayehu, F. Gurum, Y. Rezene, C. Finenissa, Mulugeta Atnafi and Chemeda Daba, 2008. Adaptation and Yield Stability of Small Red Bean Elite Lines in Ethiopia. International Journal of Plant Breeding and Genetics, 2: 51-63.

DOI: 10.3923/ijpbg.2008.51.63

URL: https://scialert.net/abstract/?doi=ijpbg.2008.51.63

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