B. Abrar Yasin
Department of Genetics and Plant Breeding, Sam Higginbottom Institute of Agriculture, Technology and Sciences (Formerly Allahabad Agriculture Institute Deemed-to-be-University), Naini Allahabad, U.P., 211007, India
M. Ram
Department of Genetics and Plant Breeding, Sam Higginbottom Institute of Agriculture, Technology and Sciences (Formerly Allahabad Agriculture Institute Deemed-to-be-University), Naini Allahabad, U.P., 211007, India
Shubhra Singh
Department of Genetics and Plant Breeding, Sam Higginbottom Institute of Agriculture, Technology and Sciences (Formerly Allahabad Agriculture Institute Deemed-to-be-University), Naini Allahabad, U.P., 211007, India
B.A Wani
Department of Genetics and Plant Breeding, Sam Higginbottom Institute of Agriculture, Technology and Sciences (Formerly Allahabad Agriculture Institute Deemed-to-be-University), Naini Allahabad, U.P., 211007, India
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How to cite this article
B. Abrar Yasin, M. Ram, Shubhra Singh and B.A Wani, 2011. Genetic Improvement in Yield, Yield Attributes and Leaf Rust Resistance in Semi-dwarf Wheat Varieties Developed in India from Last 40 Years. International Journal of Agricultural Research, 6: 747-753.
DOI: 10.3923/ijar.2011.747.753
URL: https://scialert.net/abstract/?doi=ijar.2011.747.753
DOI: 10.3923/ijar.2011.747.753
URL: https://scialert.net/abstract/?doi=ijar.2011.747.753
Yousef sami Reply
A very informative paper, congratulations to authors for such a nice work.