Chen Yong
Institute of Electronic Engineering, CAEP, 621900, Mianyang, China
Cheng Yong-sheng
Institute of Electronic Engineering, CAEP, 621900, Mianyang, China
ABSTRACT
Firstly, the physical mechanism of characteristic of capacitor under strong stress is discussed theoretically in the study. Secondly, as to the multi-fields coupling simulation, this study put originally forward a simple method to simulate the physical process by establishing the interface between ANSYS/LS-DYNA module and ANSYS/EMAG module in order to overcome the difficulty of no available software for the simulation at present. Finally, hammerblow test was carried out to study the phyiscal process fartherly and the test result was analyzed.
PDF References Citation
Received: June 07, 2013;
Accepted: October 06, 2013;
Published: November 16, 2013
How to cite this article
Chen Yong and Cheng Yong-sheng, 2013. Research on Characteristic of Capacitor under Strong Stress. Journal of Applied Sciences, 13: 5483-5487.
DOI: 10.3923/jas.2013.5483.5487
URL: https://scialert.net/abstract/?doi=jas.2013.5483.5487
DOI: 10.3923/jas.2013.5483.5487
URL: https://scialert.net/abstract/?doi=jas.2013.5483.5487
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