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Gh. Solookinejad and M. Jabbari, 2011. Extracting X-ray Reflectivity Profile of ZnO Thin Film using Atomic Force Microscopy Data. Trends in Applied Sciences Research, 6: 1230-1237.
URL: https://scialert.net/abstract/?doi=tasr.2011.1230.1237
URL: https://scialert.net/abstract/?doi=tasr.2011.1230.1237