Chen Yong
Institute of Electronic Engineering, CAEP, 621900, Mianyang, China
Cheng Yong-sheng
Institute of Electronic Engineering, CAEP, 621900, Mianyang, China
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How to cite this article
Chen Yong and Cheng Yong-sheng, 2013. Research on Characteristic of Capacitor under Strong Stress. Journal of Applied Sciences, 13: 5483-5487.
DOI: 10.3923/jas.2013.5483.5487
URL: https://scialert.net/abstract/?doi=jas.2013.5483.5487
DOI: 10.3923/jas.2013.5483.5487
URL: https://scialert.net/abstract/?doi=jas.2013.5483.5487