K.J. Kumaresh
School of Electrical and Electronics Engineering, Centre for Nanotechnology and Advanced Biomaterials, SASTRA University, Thanjavur, 613 401, India
P. Deepak Raj
Functional Nanomaterials and Devices Lab, Centre for Nanotechnology and Advanced Biomaterials, SASTRA University, Thanjavur, 613 401, India
M. Sridharan
Functional Nanomaterials and Devices Lab, Centre for Nanotechnology and Advanced Biomaterials, SASTRA University, Thanjavur, 613 401, India
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K.J. Kumaresh, P. Deepak Raj and M. Sridharan, 2014. Al and Cu Thin Film Capacitors for Void Fraction Measurement. Asian Journal of Applied Sciences, 7: 809-813.
DOI: 10.3923/ajaps.2014.809.813
URL: https://scialert.net/abstract/?doi=ajaps.2014.809.813
DOI: 10.3923/ajaps.2014.809.813
URL: https://scialert.net/abstract/?doi=ajaps.2014.809.813