Y. Vijayakumar
Department of Physics, Thin Films Laboratory, Osmania University, Hyderabad, 500007, India
R. Sayanna
Department of Physics, Thin Films Laboratory, Osmania University, Hyderabad, 500007, India
M.V. Ramana Reddy
Department of Physics, Thin Films Laboratory, Osmania University, Hyderabad, 500007, India
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How to cite this article
Y. Vijayakumar, R. Sayanna and M.V. Ramana Reddy, 2014. Annealing Effect on Structural, Optical and Electrical Properties of V2O5
Thin Films by Dip Coating. Asian Journal of Applied Sciences, 7: 753-760.
DOI: 10.3923/ajaps.2014.753.760
URL: https://scialert.net/abstract/?doi=ajaps.2014.753.760
DOI: 10.3923/ajaps.2014.753.760
URL: https://scialert.net/abstract/?doi=ajaps.2014.753.760